The NEO PV Master products offer quick and reliable inspection and evaluation of solar plants, featuring a fully automatic AI-based system diagnostic. With up to 24 input channels (PV Master 80) and a rating of up to 1600V DC, the smart IV-curve diagnostic function enables simultaneous evaluation of multiple PV strings and complete PV arrays.

The world's first and most powerful solar power plant diagnostic system.

This technology records the voltage and current profile (IV curve) of PV panels from the open-circuit voltage (Voc) to the short-circuit current (Isc) by applying a load. Based on the shape of the curve, various faults can be detected and differentiated. Additionally, it is the only method to detect mismatch losses.

Easily detect:

• Mismatch Losses: The only method to detect mismatch losses.
• Shading: Detection of shading and estimation of lost yearly revenue.
• Soiling/Contamination: Using intelligent algorithms.
• Bypass Diode Failure: Detection of broken diodes (open or short circuit).
• Hotspots: Detection of hotspots even at low irradiance.
• PID (Potential Induced Degradation): Detection of potential induced degradation.
• Cell Cracks/Broken Glass: And other faults.

IEC 62446-2: Fully compliant.

The following picture shows an example of a simultaneous measurement of a PV array with 17 strings:

Using single-channel IV tracing systems can be very time-consuming (days) for inspecting large solar farms (e.g., 400 strings for 3 MW). In contrast, a multi-channel IV-curve tracing system can inspect solar power plants in a much shorter time (~4 hours per MW) and provide valuable information about mismatch losses.

The following table provides a comparison of different PV/solar inspection methods: